Lecture: X-ray diffraction techniques for materials characterization

prof. Alessandra Varone


X-ray production and interaction with matter. Bragg’s law. The diffractometer and the Debye-Scherrer camera. Determination of the crystal structure. Ordered structures and measurement of the order degree. Systematic and random errors in X-ray diffraction experiments. High precision measurement of lattice parameters. Phase diagrams: determination of solvus curves. The JCPDS database and identification of unknown compounds. Determination of the phase fractions in a polyphasic material. The Scherrer’s equation. Measurement of residual stresses. Analysis of peak profile for determining the density of lattice defects. Advanced instruments for X-ray diffraction experiments.